铜导线的短路熔痕与过热熔断熔痕分析
Analysis on Short Circuited Melted Marks and Over-heated Melted Mark of Copper Wire
刘筱薇1, 金应荣2
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作者单位：(1. 重庆科技学院 冶金与材料工程学院, 重庆 401331; 2. 西华大学 材料科学与工程学院, 四川 成都 610039)
中文关键字：熔痕； 过热； 铜导线
英文关键字：melted mark; over-heated; copper conducting wire
中文摘要：分析了某机电产品火灾事故中的两种铜导线熔痕，观察到一种电流过载引起的铜导线过热熔断熔痕，它由未熔化的再结晶区、融合形成的粗晶粒区以及快速冷却形成的细晶粒区组成，且粗晶粒区和细晶粒区之间有明确的界限。结果表明，该过热熔断熔痕是一次熔痕，是引起火灾事故的直接原因。
英文摘要：The short circuited melted marks and the over-heated melted mark of copper wire were analyzed. The latter one is the primary melted mark of the accident which microstructure can be divided into three areas, that is, the recrystallization area, the coarse grain area and the fine grain area. There is an obvious boundary between the coarse grain area and the fine grain area. The results show that the over-heated melted mark is one-time melted mark and the immediate cause of leading to the accident.