铝合金导线短路熔痕晶粒生长规律分析

    Analysis on Grain Growth Law of Aluminum Alloy Wire Short Circuit Melted Marks

    • 摘要: 采用分段定性与定量分析的方法,将铝合金导线短路熔痕沿晶粒生长的方向,依次划分为a~e区域。在晶粒形成原理的基础上,针对铝合金导线一次短路、二次短路熔痕的晶粒生长规律进行探究。结果表明:铝合金导线一次短路与二次短路熔痕的晶粒生长规律在b区差异较大,可作为区分依据。

       

      Abstract: The short-circuit melted marks of aluminum alloy wires were successively divided into a-e regions along the direction of grain growth by the method of segmented qualitative and quantitative analysis. Based on the principle of grain formation, the grain growth rules of the first and second short-circuit melted marks of aluminum alloy wires were investigated.The results show that the grain growth law of aluminum alloy wires is different between first short circuit and second short circuit in zone b, which can be used as the basis for distinguishing.

       

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